Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11959880 | Method and apparatus for measurement of material condition | Scott Denenberg, Yanko K. Sheiretov, Neil J. Goldfine, Todd M Dunford, Andrew P. Washabaugh +1 more | 2024-04-16 |