Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Controlled toggle rate of non-test signals during modular scan testing of an integrated circuit

Controlled toggle rate of non-test signals during modular scan testing of an integrated circuit

US Patent 8914689 · Granted Dec 16, 2014

Estimated economic value: $10,532,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Cryptographic computing isolation for multi-tenancy and secure software componen2025
Stateless and low-overhead domain isolation using cryptographic computing2025
Cryptographic computing in multitenant environments2025
Message authentication Galois integrity and correction (MAGIC) for lightweight r2025
Cryptographic system memory management2025
Updating encrypted security context in stack pointers for exception handling and2025
Efficient security metadata encoding in error correcting code (ECC) memory witho2024
Cryptographic isolation of memory compartments in a computing environment2024
Secure error correcting code (ECC) trust execution environment (TEE) configurati2024
Algebraic and deterministic memory authentication and correction with coupled ca2024
Data relocation for inline metadata2024
Object and cacheline granularity cryptographic memory integrity2024