Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus of physical property measurement using a probe-based nano-localized light source

Method and apparatus of physical property measurement using a probe-based nano-localized light source

US Patent 8881311 · Granted Nov 4, 2014

Estimated economic value: $9,213,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automated touchless registration for surgical navigation2025
Stereoscopic visualization camera and integrated robotics platform with force/to2025
Registration degradation correction for surgical navigation procedures2024
Methods and systems for scanning probe sample property measurement and imaging2024
Indicating a status of an analytical instrument on a screen of the analytical in2024
Torsion wing probe assembly2023
Torsion wing probe assembly2021
Method and apparatus of operating a scanning probe microscope2021
Infrared characterization of a sample using oscillating mode2020
Method and apparatus of using peak force tapping mode to measure physical proper2020
Peakforce photothermal-based detection of IR nanoabsorption2019
Method and apparatus of operating a scanning probe microscope2019