Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for utilizing in-situ measurements techniques in conjunction with thermoelectric chips (TECs)

Method and apparatus for utilizing in-situ measurements techniques in conjunction with thermoelectric chips (TECs)

US Patent 8794011 · Granted Aug 5, 2014

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for improved melting in three-dimensional printing processes2025
Vibration reduction system for precision robotics applications2024
Balanced active stabilizers2024
Vibration isolation systems with reaction masses and actuators2024
Methods for using extracellular adenosine inhibitors and adenosine receptor inhi2022
Separable instrument driver handle2020
Angled orthopaedic driver2019
Methods for using extracellular adenosine inhibitors and adenosine receptor inhi2019
Lithography tool having a reticle stage capable of dynamic reticle bending to co2019
Liquid jet and recovery system for immersion lithography2019
Wafer bonding system and method2018
Fly's eye optical mirror with a plurality of optical elements rotationally align2018