Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measuring probe for a vector network analysis system

Measuring probe for a vector network analysis system

US Patent 8760184 · Granted Jun 24, 2014

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method of determining scattering parameters using measurement arrangement having2016
Method of determining scattering parameters using measurement arrangement having2016
Contactless measuring system for contactless decoupling of a signal running on a2016
Measuring system for determining scatter parameters2015
Measuring system for determining scatter parameters2015
Contactless loop probe2015
Contactless loop probe2015
Contactless measuring system for near field measurement of a signal waveguide2014
Measurement arrangement having a calibration substrate and electronic circuit2014
Measurement arrangement having a calibration substrate and electronic circuit2014
HF measurement system, method for the calibration thereof, and method for determ2013
Loop-type directional coupler2012