Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9470713 | Method of determining scattering parameters using measurement arrangement having a calibration substrate and electronic circuit | Bernd Geck | 2016-10-18 |
| 9291644 | Contactless measuring system for contactless decoupling of a signal running on a signal waveguide | — | 2016-03-22 |
| 9116189 | Measuring system for determining scatter parameters | Bernd Geck | 2015-08-25 |
| 8963570 | Contactless loop probe | Bernd Geck | 2015-02-24 |
| 8803538 | Contactless measuring system for near field measurement of a signal waveguide | — | 2014-08-12 |
| 8791705 | Measurement arrangement having a calibration substrate and electronic circuit | Bernd Geck | 2014-07-29 |
| 8760184 | Measuring probe for a vector network analysis system | Bernd Geck | 2014-06-24 |
| 8452565 | HF measurement system, method for the calibration thereof, and method for determining scattering parameters with this HF measurement system | — | 2013-05-28 |
| 8121574 | Loop-type directional coupler | — | 2012-02-21 |