Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9470713 | Method of determining scattering parameters using measurement arrangement having a calibration substrate and electronic circuit | Thomas Zelder | 2016-10-18 |
| 9116189 | Measuring system for determining scatter parameters | Thomas Zelder | 2015-08-25 |
| 8963570 | Contactless loop probe | Thomas Zelder | 2015-02-24 |
| 8791705 | Measurement arrangement having a calibration substrate and electronic circuit | Thomas Zelder | 2014-07-29 |
| 8760184 | Measuring probe for a vector network analysis system | Thomas Zelder | 2014-06-24 |
| 7583907 | Method for adjusting a fusing device of a digital printing machine by determining the humidity of printing material and measuring device to detect the reflectance of microwave signals at a print material | Knut Behnke, Frank-Michael Morgenweck, Domingo Rohde, Lars Seimetz, Oliver Klemp | 2009-09-01 |