Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for inspecting pattern defect and device for realizing the same

Method for inspecting pattern defect and device for realizing the same

US Patent 8748795 · Granted Jun 10, 2014

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Defect inspection device2025
Defect inspection apparatus and defect inspection method2025
Gear machining apparatus2025
Defect inspection device, defect inspection method, and adjustment substrate2025
Vehicle exterior part2025
Defect inspection device and defect inspection method2025
Air conditioner2025
Semiconductor device2025
Ranging system, calibration method, program, and electronic apparatus2025
Heat exchange unit and air conditioner2025
Heat exchanger and air-conditioning apparatus2024
Pipe coupling structure and refrigeration cycle apparatus2024