Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and systems for testing electronic circuits

Methods and systems for testing electronic circuits

US Patent 8694845 · Granted Apr 8, 2014

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Distance estimation using signals of different frequencies2022
Methods and systems for testing electronic circuits2015
Receiver chain gain selection2014
Auxiliary control device for air conditioning system2013
Efficient power amplifier2012
Method and apparatus for transmitter calibration2009
Method and apparatus for calibrating filtering of a transceiver2008
Turbo-charged relaxation oscillator method and apparatus2006
Planar spiral inductor structure with patterned microelectronic structure integr2006
Metal-insulator-metal (MIM) capacitor structure in copper-CMOS circuits using a 2005
Method for making a new metal-insulator-metal (MIM) capacitor structure in coppe2004
Method of fabricating a damascene copper inductor structure using a sub-0.18 um 2003