Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for verifying a test substrate in a prober under defined thermal conditions

Method for verifying a test substrate in a prober under defined thermal conditions

US Patent 8692567 · Granted Apr 8, 2014

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe system and machine apparatus thereof2025
Method for compensating to distance between probe tip and device under test afte2022
Wafer probe station2022
Control method of touch display apparatus2021
Display method of display apparatus2021
Wafer probe station2021
Probe systems and methods that utilize a flow-regulating structure for improved 2020
Method for compensating probe misplacement and probe apparatus2019
Shielded probe systems with controlled testing environments2019
Wafer cassette2018
Operating method for inspecting equipment2018
Shielded probe systems with controlled testing environments2017