Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Electron-optical system for high-speed and high-sensitivity inspections

Electron-optical system for high-speed and high-sensitivity inspections

US Patent 8664594 · Granted Mar 4, 2014

Estimated economic value: $15,091,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Creating multiple electron beams with a photocathode film2025
Method and system of image-forming multi-electron beams2024
Joint electron-optical columns for flood-charging and image-forming in voltage c2024
Tilt-column multi-beam electron microscopy system and method2024
High throughput multi-electron beam system2024
Systems and methods of creating multiple electron beams2023
Systems for incorporating LiDAR sensors in a headlamp module of a vehicle2023
High resolution electron beam apparatus with dual-aperture schemes2022
Electron beam system for inspection and review of 3D devices2022
Micro stigmator array for multi electron beam system2021
High resolution electron energy analyzer2021
System and method for cleaning optical surfaces of an extreme ultraviolet optica2021