Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test specimen for testing through-thickness properties

Test specimen for testing through-thickness properties

US Patent 8650975 · Granted Feb 18, 2014

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Wide-gamut-color image formation and projection2020
In-chamber electron detector2012
Particle detector suitable for detecting ions and electrons2006
Angular aperture shaped beam system and method2005
Shaped and low density focused ion beams2005
Collection of secondary electrons through the objective lens of a scanning elect2005
Focused ion beam system with coaxial scanning electron microscope2005
Electron beam system using multiple electron beams2004
Multi-column FIB for nanofabrication applications2004
Focused ion beam system2004
Through-the-lens neutralization for charged particle beam system2004
Method and apparatus for enhancing yield of secondary ions2002