Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › System and method of aligning a sample

System and method of aligning a sample

US Patent 8638437 · Granted Jan 28, 2014

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Sample alignment system in reflectometers, ellipsometers, spectrophotometers and2025
System for, and calibration and testing of directed beam ellipsometer systems2025
System for, and calibration and testing of directed beam ellipsometer systems2025
Reflectometer, spectrophotometer, ellipsometer or polarimeter system including s2024
Fast and accurate Mueller matrix infrared ellipsometer2023
Fast and accurate mueller matrix infrared spectroscopic ellipsometer2023
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2023
Snapshot ellipsometer2022
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2021
Beam focusing and reflective optics2021
Systems and methods for producing a more uniform intensity wavelength dispersed 2020
Systems and methods for producing a more uniform intensity wavelength dispersed 2020