Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Scatterometry measurement of asymmetric structures

Scatterometry measurement of asymmetric structures

US Patent 8525993 · Granted Sep 3, 2013

Estimated economic value: $1,909,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Forward library based seeding for efficient X-ray scatterometry measurements2025
Robotic vacuum cleaner2025
Robotic vacuum cleaner2025
Memory arrays, and methods of forming memory arrays2025
Cooking apparatus and control method, control device, and storage medium thereof2025
Thermal radiation element, thermal radiation element module, and thermal radiati2025
Quick release device2025
Nanocrystals2025
Display method, electronic device, and system2025
Method and system of using USB user interface in electronic torque wrench2025
Data packet sending method and apparatus2025
Control method and apparatus2025