Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Holding member for use in test and method for manufacturing same

Holding member for use in test and method for manufacturing same

US Patent 8468690 · Granted Jun 25, 2013

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Wafer inspection system2024
Wafer inspection system2023
Wafer inspection system2023
Processing apparatus and processing method2022
Wafer inspection system, wafer inspection apparatus and prober2021
Test head and wafer inspection apparatus2021
Wafer inspection system, wafer inspection apparatus and prober2020
Film formation method and film formation apparatus2017
Maintenance carriage for wafer inspection apparatus and maintenance method for w2017
Film forming apparatus2015
Probe2014
Structure of probe card for inspecting electrical characteristics of object to b2014