Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe card having a structure for being prevented from deforming

Probe card having a structure for being prevented from deforming

US Patent 8415964 · Granted Apr 9, 2013

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Cantilevered probe having a bending contact2014
Probe device having a structure for being prevented from deforming2012
Probe device having a structure for being prevented from deforming2012
Contact structure for inspection2012
Mechanism for fixing probe card2011
Mechanism for fixing probe card2011
Probe device and method of regulating contact pressure between object to be insp2010
Probe and method of manufacturing probe2010
Mechanism for fixing probe card2004
Vacuum coupling system2001
Semiconductor wafer holder with spring-mounted temperature measurement apparatus2000
Apparatus for aligning a semiconductor wafer with an inspection contactor1999