Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and apparatus for inspecting defects of semiconductor device

Method and apparatus for inspecting defects of semiconductor device

US Patent 8385627 · Granted Feb 26, 2013

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Processor system and failure diagnosis method2025
Arithmetic operation device, testing method2025
Distributed system and data transmission method2025
Facility diagnosis device and facility diagnosis method2025
Distributed system and data transfer method2025
Distributed system and data processing method2024
Electronic device and attack detection method of electronic device2024
Electronic control unit2024
Programmable device, and controller using the same2023
Electronic control unit and determination method2023
Prediction control device and method2022
Work support device, work support method, and work support program2022