Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Driven metal critical dimension (CD) biasing

Driven metal critical dimension (CD) biasing

US Patent 8375347 · Granted Feb 12, 2013

Estimated economic value: $6,429,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Package structure, semiconductor device and manufacturing method thereof2025
Semiconductor packages and methods of manufacturing thereof2025
Integrated circuit having hybrid sheet structure2025
Flip-flop circuit and method2025
Data retention circuit and method2025
Integrated circuit structure and method for manufacturing the same2025
Integrated circuit device with improved layout2025
Power rail and signal conducting line arrangement2025
Integrated circuit die with memory macro including through-silicon via and metho2025
Flip-flop device and method of operating flip-flop device2025
Integrated circuit structure2025
Semiconductor package having an encapulant comprising conductive fillers and met2025