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Home › On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability

On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability

US Patent 8286042 · Granted Oct 9, 2012

Estimated economic value: $12,095,000 ⓘ

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