Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and systems for determining a position of inspection data in design data space

Methods and systems for determining a position of inspection data in design data space

US Patent 8041103 · Granted Oct 18, 2011

Estimated economic value: $12,962,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automatic method to find extent of repeating geometry in an integrated circuit l2025
Finding semiconductor defects using convolutional context attributes2025
High efficiency laser-sustained plasma light source with collection of broadband2023
System and method for generation of wafer inspection critical areas2022
Print check repeater defect detection2022
Repeater defect detection2021
Differential imaging for single-path optical wafer inspection2021
System, method and non-transitory computer readable medium for tuning sensitivit2021
Plasma cell for providing VUV filtering in a laser-sustained plasma light source2021
High efficiency laser-sustained plasma light source2021
And noise based care areas2020
Neutral atom imaging system2020