Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Finding semiconductor defects using convolutional context attributes

Finding semiconductor defects using convolutional context attributes

US Patent 12353970 · Granted Jul 8, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automatic method to find extent of repeating geometry in an integrated circuit l2025
Segmentation of design care areas with a rendered design image2024
Inspection of reticles using machine learning2024
Inspection with previous step subtraction2024
Setting up inspection of a specimen2023
Defect inspection and review using transmissive current image of charged particl2022
Wafer inspection using difference images2022
Inspection of reticles using machine learning2022
Apparatus and methods for measuring phase and amplitude of light through a layer2021
And noise based care areas2020
Arbitrary wavefront compensator for deep ultraviolet (DUV) optical imaging syste2020
Creating defect samples for array regions2020