Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Specimen holder, specimen inspection apparatus, and specimen inspection method

Specimen holder, specimen inspection apparatus, and specimen inspection method

US Patent 8030622 · Granted Oct 4, 2011

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Alignment device and alignment method2025
Biological tissue image processing system, and machine learning method2023
Control method for electron microscope and electron microscope2022
Orientation device, production method for magnetic recording medium, and magneti2022
Defect inspection device and defect inspection method2017
Apparatus for inspecting defect with time/spatial division optical system2017
Inspection system2017
Apparatus and method for inspecting pattern defect2015
Method and apparatus for reviewing defects2015
Inspection apparatus2014
Method and apparatus for inspecting patterns formed on a substrate2014
Defect inspection method and device thereof2014