Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11404238 | Control method for electron microscope and electron microscope | — | 2022-08-02 |
| 8158937 | Particle beam system | Hidetoshi Nishiyama | 2012-04-17 |
| 8119994 | Apparatus and method for inspecting sample | Hidetoshi Nishiyama | 2012-02-21 |
| 8030622 | Specimen holder, specimen inspection apparatus, and specimen inspection method | Hidetoshi Nishiyama, Mitsuo Suga | 2011-10-04 |
| 7906760 | Inspection method and reagent solution | Hidetoshi Nishiyama, Mitsuo Suga | 2011-03-15 |
| 7745802 | Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder | Hidetoshi Nishiyama | 2010-06-29 |
| 7632486 | Method for diagnosing bone metastasis of malignant tumor | Etsuro Ogata, Shunji Takahashi | 2009-12-15 |
| 6831278 | System and method for electron beam irradiation | Masanobu Yamamoto, Hiroshi Kawase, Jun Sasaki, Minoru Takeda, Gakuo Komatsubara +2 more | 2004-12-14 |
| 6737660 | Electron beam irradiation apparatus and electron beam irradiating method | Yoshihisa Miura, Yuichi Aki, Hiroshi Kawase, Masanobu Yamamoto, Naoki Date +2 more | 2004-05-18 |