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Home › Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array

Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array

US Patent 7859277 · Granted Dec 28, 2010

Estimated economic value: $10,163,000 ⓘ

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