Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Semiconductor integrated circuit device and inspection method therefor

Semiconductor integrated circuit device and inspection method therefor

US Patent 7844874 · Granted Nov 30, 2010

Estimated economic value: $134,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Defect classification device and defect classification program2025
Wafer observation apparatus and wafer observation method2023
Anti-GPR20 antibody and anti-GPR20 antibody-drug conjugate2022
Defect observation device2021
Sample observation device and sample observation method2021
Defect observation device and defect observation method2021
Wafer observation device2021
Defect observation system and defect observation method for semiconductor wafer2021
Anti-GPR20 antibody and anti-GPR20 antibody-drug conjugate2021
Defect classification apparatus and defect classification method2020
Defect observation device2020
Sample observation device and sample observation method2020