Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Built-in self-test of 3-dimensional semiconductor memory arrays

Built-in self-test of 3-dimensional semiconductor memory arrays

US Patent 7797594 · Granted Sep 14, 2010

Estimated economic value: $23,220,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Managing radio-based private networks2025
Routing protocol processing intermediaries for cloud computing environments2025
Dual-stack network addressing in cloud provider network edge locations2025
Capacity management for radio-based applications2025
Interfaces for creating radio-based private networks2025
Scheduling use of heterogeneous frequency schemes for radio-based networks2025
Transparent migration of radio-based applications2025
On-demand application-driven network slicing2025
Extending cloud-based virtual private networks to radio-based networks2024
Mobility of cloud compute instances hosted within communications service provide2024
Managing computing capacity in radio-based networks2024
Interfaces for creating radio-based private networks2024