Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe card for semiconductor IC test and method of manufacturing the same

Probe card for semiconductor IC test and method of manufacturing the same

US Patent 7768285 · Granted Aug 3, 2010

Estimated economic value: $110,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Tire2025
Probe card and semiconductor wafer inspection method using the same2014
Wafer inspection device2014
Probe, electronic device test apparatus, and method of producing the same2013
Wafer inspection device and semiconductor wafer inspection method using the same2013
Probe card, method of manufacturing the probe card and alignment method2011
Method and apparatus for wafer level burn-in2011
Semiconductor IC and testing method thereof2010
Probe card having a conductive thin film on the surface of an insulating film be2009
Semiconductor wafer and testing method therefor2007
Semiconductor wafer package, method and apparatus for connecting testing IC term2001
Motor, structure of stator of the motor and assembly method of the stator2000