Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for material testing of microscale and nanoscale samples

Apparatus and method for material testing of microscale and nanoscale samples

US Patent 7752916 · Granted Jul 13, 2010

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatus and method for in situ testing of microscale and nanoscale samples2015
Apparatus and method for in situ testing of microscale and nanoscale samples2013
Microtesting rig with variable compliance loading fibers for measuring mechanica2012
Dual function indenter2005
Unified test system and method for testing printed circuit boards2001