Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7752916 | Apparatus and method for material testing of microscale and nanoscale samples | M. Taher A. Saif, Michael D. Uchic | 2010-07-13 |
| 6259265 | Unified test system and method for testing printed circuit boards | Yong-Taek Sim, Tae Y. Kwak | 2001-07-10 |