Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9019512 | Apparatus and method for in situ testing of microscale and nanoscale samples | Wonmo Kang | 2015-04-28 |
| 8351053 | Apparatus and method for in situ testing of microscale and nanoscale samples | Wonmo Kang | 2013-01-08 |
| 7752916 | Apparatus and method for material testing of microscale and nanoscale samples | Jong H. Han, Michael D. Uchic | 2010-07-13 |