Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Testing differential signal standards using device under test's built in resistors

Testing differential signal standards using device under test's built in resistors

US Patent 7728604 · Granted Jun 1, 2010

Estimated economic value: $5,390,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Managing metadata switches and platform licenses in a distributed system2025
Simultaneous beamforming and nullforming for secure wireless communications2023
Distributed adaptive beamforming and nullforming for secure wireless communicati2023
Active matching network design for electrically small resonant antennas2022
Wireless communication method for secure side-channel signaling and authenticati2020
Windowing methods and systems for use in time-frequency analysis2016
Wireless communication method and system for transmission authentication at the 2015
Method and system for optimizing signal recognition in a multiwavelength optical2015
Method and implementation for information exchange using Markov models2014
Method and circuit for testing accuracy of delay circuitry2014
Parallel testing of an integrated circuit that includes multiple dies2012
Testing an integrated circuit having configurable input/output terminals2011