Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › End of line performance prediction

End of line performance prediction

US Patent 7650199 · Granted Jan 19, 2010

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Determining die performance by incorporating neighboring die performance metrics2012
Automated control thread determination based upon post-process consideration2008
Method and apparatus for multivariate fault detection and classification2007
Method and apparatus for detecting faults using principal component analysis par2007
Composite spacer liner for improved transistor performance2005
Maintaining LDD series resistance of MOS transistors by retarding dopant segrega2004
Narrow width CMOS devices fabricated on strained lattice semiconductor substrate2004
Method of forming source/drain regions in a semiconductor device2004
Tilted counter-doped implant to sharpen halo profile2003
Removable spacer technique2003
Asymmetrical N-channel and P-channel devices2003
Elevated transistor fabrication technique2002