Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for reducing charge damage in silicon-on-insulator technology

Method and system for reducing charge damage in silicon-on-insulator technology

US Patent 7638412 · Granted Dec 29, 2009

Estimated economic value: $12,029,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Activity-based collateral modeling2023
Methods and materials for identifying therapeutic response in chronic myeloid le2019
Apparatus and methods for qualifying HEMT FET devices2016
Budgeting electromigration-related reliability among metal paths in the design o2012
Segmented power amplifier with varying segment activation2012
Methodology for assessing degradation due to radio frequency excitation of trans2011
Method and apparatus for evaluating the effects of stress on an RF oscillator2010
Integrated circuit modeling, design, and fabrication based on degradation mechan2010
Current-voltage-based method for evaluating thin dielectrics based on interface 2010
Thermal treatment of nitrided oxide to improve negative bias thermal instability2010
Method to identify or screen VMIN drift on memory cells during burn-in or operat2008
Method and system for reducing charge damage in silicon-on-insulator technology2007