Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methodology for assessing degradation due to radio frequency excitation of transistors

Methodology for assessing degradation due to radio frequency excitation of transistors

US Patent 7974595 · Granted Jul 5, 2011

Estimated economic value: $9,107,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Electronic device and multilevel package substrate with integrated filter2025
Methods and compositions for natural killer cells2025
Bleed valve assembly for aircraft engines2025
Methods and apparatus for voltage buffering2024
Thin film molecular memory2024
Intermediate frequency amplifier with a configurable high-pass filter2024
Methods and apparatus to reduce variations for on-off keying transmissions2024
Magnetoelectric majority gate device2023
Magnetoelectric XNOR logic gate device2023
Self-calibrating on-off keying based digital isolator2023
Magnetoelectric inverter2023
Amplifiers with feedforward cancellation2023