Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Focused ion beam system and a method of sample preparation and observation

Focused ion beam system and a method of sample preparation and observation

US Patent 7612337 · Granted Nov 3, 2009

Estimated economic value: $81,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Steel sheet2025
Steel sheet and method for producing same2025
Metasurface element, electron tube, and method for producing electron tube2025
Airbag device for instrument panel upper surface2025
Steel sheet and manufacturing method thereof2025
Passenger seat airbag device2025
Operation information collection system for fluid control device, fluid control 2025
Steel sheet and manufacturing method thereof2025
Medical image processing apparatus, X-ray diagnostic apparatus, and method of me2025
Steel sheet and method for producing same2025
Sanitary equipment part2025
Alkaline battery and method of producing negative electrode gel for alkaline bat2025