Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Modeling and measuring structures with spatially varying properties in optical metrology

Modeling and measuring structures with spatially varying properties in optical metrology

US Patent 7515282 · Granted Apr 7, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Display panel having fan-out line layer located in different layer from driving 2025
Method and apparatus for generating text2025
Imaging reflectometry for inline screening2025
High-voltage battery disconnect method and motor vehicle using the same2025
Diagnostics and mitigation of battery cell failure with passive disconnect2025
Holistic analysis of multidimensional sensor data for substrate processing equip2025
Ultrashort pulses in LiDAR systems2025
Information generation method, apparatus, electronic device, and computer-readab2025
Receive path for LiDAR system2025
2D scanning high precision LiDAR using combination of rotating concave mirror an2025
LiDAR systems and methods for focusing on ranges of interest2025
2D scanning high precision LiDAR using combination of rotating concave mirror an2025