Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Parallel profile determination for an optical metrology system

Parallel profile determination for an optical metrology system

US Patent 7469192 · Granted Dec 23, 2008

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Systems and methods for signaling source picture timing information in video cod2025
3D video decoding apparatus and 3D video coding apparatus2025
Systems and methods for signaling reference pictures in video coding2025
Systems and methods for reducing a reconstruction error in video coding based on2025
Systems and methods for signaling output layer set information in video coding2025
Systems and methods for signaling types of pictures and associated information i2025
Method and apparatus for generating text2025
Systems and methods for performing chroma local illumination compensation deriva2025
Systems and methods for proxy card and/or wallet redemption card transactions2025
Systems and methods for signaling network abstraction layer unit information in 2025
Systems and methods for signaling picture information in a slice header in video2025
System and method for capturing notes on a mobile device2025