Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for merging wafer test results

Method and system for merging wafer test results

US Patent 7383259 · Granted Jun 3, 2008

Estimated economic value: $7,030,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System-on-a-chip and power gating circuit thereof2010
Semiconductor CP (circuit probe) test management system and method2009
Validation system with flow control capability2009
System and method for check-in control in wafer testing2006
Fuzzy reasoning model for semiconductor process fault detection using wafer acce2006
Method and system for auto dispatching wafer2002