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Home › High-speed TDF testing on low cost testers using on-chip pulse generators and dual ATE references for rapidchip and ASIC devices

High-speed TDF testing on low cost testers using on-chip pulse generators and dual ATE references for rapidchip and ASIC devices

US Patent 7375570 · Granted May 20, 2008

Estimated economic value: $4,967,000 ⓘ

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