Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of measuring the leakage current of a deep trench isolation structure

Method of measuring the leakage current of a deep trench isolation structure

US Patent 7298159 · Granted Nov 20, 2007

Estimated economic value: $5,181,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Contact array optimization for ESD devices2018
System and method for providing a poly cap and a no field oxide area to prevent 2011
Electrical test structure and method for characterization of deep trench sidewal2011
Electrical test structure and method for characterization of deep trench sidewal2011
System and method for increasing breakdown voltage of LOCOS isolated devices2011
Method of controlling the breakdown voltage of BSCRs and BJT clamps2010
Method of forming a silicide bridged anti-fuse with a tungsten plug metalization2009
System and method for providing a poly cap and a no field oxide area to prevent 2009
Method of forming a circuit having subsurface conductors2009
Method of forming a high-voltage silicon controlled rectifier structure with imp2007
Multi-source, multi-gate MOS transistor with a drain region that is wider than t2007
Method of forming a semiconductor structure with non-uniform metal widths2007