Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Memory having internal column counter for compression test mode

Memory having internal column counter for compression test mode

US Patent 7123542 · Granted Oct 17, 2006

Estimated economic value: $214,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Integrated circuit including an ECC error counter2012
Integrated circuit that stores defective memory cell addresses2011
Integrated circuit with control circuit for performing retention test2011
Integrated circuit that stores first and second defective memory cell addresses2010
Memory module with test structure2008
Parallel read for front end compression mode2008
Method and auxiliary device for testing a RAM memory circuit2007
Integrated semiconductor memory with redundant memory cells replaceable for eith2007
Dual frequency first-in-first-out structure2007
Flexible internal address counting method and apparatus2007
Integrated circuit with a test circuit2006
Circuit device with clock pulse detection facility2006