Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and apparatus for laser marking of integrated circuit faults

Methods and apparatus for laser marking of integrated circuit faults

US Patent 7020582 · Granted Mar 28, 2006

Estimated economic value: $11,682,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Integrated circuits with in-field diagnostic and repair capabilities2022
Heat spreading in molded semiconductor packages2018
Imaging systems and methods for using in spatially constrained locations2017
Lens-free imaging system and method for detecting particles in sample deposited 2017
Self-illuminating CMOS imaging package2017
Automated cell growth/migration detection system and associated methods2016
Synchronization of image acquisition in multiple image sensors with a synchroniz2016
Shared terminal of an image sensor system for transferring image data and contro2016
Identifying predictive models resistant to concept drift2015
Acquiring global shutter-type video images with CMOS pixel array by strobing lig2015
Shared terminal of an image sensor system for transferring image data and contro2014
Shared terminal of an image sensor system for transferring clock and control sig2014