Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Test circuit capable of testing embedded memory with reliability

Test circuit capable of testing embedded memory with reliability

US Patent 7007215 · Granted Feb 28, 2006

Estimated economic value: $139,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Drive circuit with improved timing margin for memory device2025
Capacitor device and manufacturing method therefor2025
Circuit assembly2024
Method for manufacturing semiconductor structure2022
Circuit assembly2022
Semiconductor memory device2021
Capacitor device and manufacturing method therefor2021
Semiconductor memory device comprising an interface conforming to JEDEC standard2021
Circuit system having compact decoupling structure2021
Semiconductor memory device for preventing occurrence of row hammer issue2020
Image sensor2019
Solid-state image pickup device with plurality of converters2018