Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Socket for testing a semiconductor device and a connecting sheet used for the same

Socket for testing a semiconductor device and a connecting sheet used for the same

US Patent 6989681 · Granted Jan 24, 2006

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor device and method for manufacturing the same2016
Apparatus for volatile organic compound treatment and method of volatile organic2010
Pressure-contact type rectifier with contact friction reducer2009
Semiconductor device test probe2007
Semiconductor device test probe2007
Semiconductor device test probe2007
Semiconductor device test probe2007
Test socket, method of manufacturing the test socket, test method using the test2006
Test socket, method of manufacturing the test socket, test method using the test2006
Power semiconductor device2005
Test probe for semiconductor devices, method of manufacturing of the same, and m2005
Test probe for semiconductor devices, method of manufacturing of the same, and m2005