Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Electromechanical module, for holding IC-chips in a chip testing system, that synchronizes and translates test signals to the IC-chips

Electromechanical module, for holding IC-chips in a chip testing system, that synchronizes and translates test signals to the IC-chips

US Patent 6958617 · Granted Oct 25, 2005

Estimated economic value: $16,598,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Multiplexed thermal control wafer and coldplate2025
Thermal control wafer with integrated heating-sensing elements2024
Thermal control wafer with integrated heating-sensing elements2024
Load port module2024
Integrated heater and temperature measurement2024
Integrated heater and temperature measurement2024
Thermal control wafer with integrated heating-sensing elements2024
Thermal control wafer with integrated heating-sensing elements2024
Multiplexed thermal control wafer and coldplate2024
Load port module2024
Integrated heater and temperature measurement2023
Integrated heater and temperature measurement2023