Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12259428 | Multiplexed thermal control wafer and coldplate | Samer Kabbani, Taneli Veistinen, Sami Mikola, Thomas P. Jones, Ari Kuukkala | 2025-03-25 |
| 12085609 | Thermal control wafer with integrated heating-sensing elements | Carl L. Ostrowski, Samer Kabbani, Enrique Aleman, Thomas P. Jones, Sorin Dinescu | 2024-09-10 |
| 12061227 | Integrated heater and temperature measurement | Carl L. Ostrowski | 2024-08-13 |
| 12013432 | Thermal control wafer with integrated heating-sensing elements | Carl L. Ostrowski, Samer Kabbani, Enrique Aleman, Thomas P. Jones, Sorin Dinescu | 2024-06-18 |
| 12000885 | Multiplexed thermal control wafer and coldplate | Samer Kabbani, Taneli Veistinen, Sami Mikola, Thomas P. Jones, Ari Kuukkala | 2024-06-04 |
| 11828796 | Integrated heater and temperature measurement | Carl L. Ostrowski | 2023-11-28 |
| 6958617 | Electromechanical module, for holding IC-chips in a chip testing system, that synchronizes and translates test signals to the IC-chips | James V. Rhodes, Robert Carlson, Carl L. Ostrowski | 2005-10-25 |
| 6924636 | System for testing one or more groups of IC-chips while concurrently loading/unloading another group | Randy Neaman Siade, James V. Rhodes, James Mason Brafford, John Montgomery, David Jon Mortensen | 2005-08-02 |
| 6919718 | System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically | Randy Neaman Siade, James V. Rhodes, James Mason Brafford, John Montgomery, David Jon Mortensen | 2005-07-19 |
| 6909299 | System for testing multiple groups of IC-chips which concurrently sends time-shifted test signals to the groups | Randy Neaman Siade, James V. Rhodes, James Mason Brafford, John Montgomery, David Jon Mortensen | 2005-06-21 |