Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated excitation/extraction system for test and measurement

Integrated excitation/extraction system for test and measurement

US Patent 6931579 · Granted Aug 16, 2005

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Extremely-fine resolution sub-ranging current mode Digital-Analog-Converter usin2019
Methods and devices relating to high gain amplifiers2019
Sensor systems and methods for analyte detection2017
Systems for detecting target chemicals and methods for their preparation and use2016
Methods and devices relating to time-variable signal processing2015
Phase/frequency synthesis using periodic sigma-delta modulated bit-stream techni2014
Generation of an analog Gaussian noise signal having predetermined characteristi2014
High-speed transceiver tester incorporating jitter injection2012
High-speed bandpass serial data link2012
Methods of parametric testing in digital circuits2012
Systems and methods for testing and diagnosing delay faults and for parametric t2011
High-speed signal testing system having oscilloscope functionality2010