Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods of parametric testing in digital circuits

Methods of parametric testing in digital circuits

US Patent 8244492 · Granted Aug 14, 2012

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

High-speed transceiver tester incorporating jitter injection2012
Systems and methods for testing and diagnosing delay faults and for parametric t2011
High-speed signal testing system having oscilloscope functionality2010
Signal integrity measurement systems and methods using a predominantly digital t2010
System and method for generating a jittered test signal2008
System and method for testing integrated circuits2007
Integrated excitation/extraction system for test and measurement2005
Programmable DC voltage generator2005