Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Detecting heat generating failures in unpassivated semiconductor devices

Detecting heat generating failures in unpassivated semiconductor devices

US Patent 6866416 · Granted Mar 15, 2005

Estimated economic value: $4,259,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Thermal enablement of dies with impurity gettering2022
Mixed storage of data fields2022
Test vehicle for package testing2021
Systems and methods for on-die heat generation and temperature sensing2020
On-die temperature sensing and digitization system2019
Circuit for and method of testing bond connections between a first die and a sec2019
Method of testing a semiconductor structure2014
Integrated circuit with MOSFET fuse element2013
Contact fuse one time programmable memory2012
Electrically programmable diffusion fuse2012
Field effect transistor having increased carrier mobility2011
Electronic fuse cell with enhanced thermal gradient2011