Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and system for storing device test information on a semiconductor device using on-device logic for determination of test results

Method and system for storing device test information on a semiconductor device using on-device logic for determination of test results

US Patent 6829737 · Granted Dec 7, 2004

Estimated economic value: $1,817,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe interposers and methods of fabricating probe interposers2008
System for storing device test information on a semiconductor device using on-de2007
Apparatus and method for reducing test resources in testing DRAMs2007
Apparatus and method for reducing test resources in testing DRAMS2006
Apparatus and method for reducing test resources in testing Rambus DRAMs2005
Apparatus and method for testing rambus DRAMs2003